000 01844cam a2200397 a 4500
001 32405
003 AE-DuAU
005 20241127172617.0
008 100615s2010 nyua b 001 0 eng
010 _a 2010022678
016 7 _a015478365
_2Uk
020 _a9780071635196 :
_c125.00
020 _a007163519X :
_c125.00
050 0 0 _aTK7871.99.M44
_bK84 2010
090 _aTK 7871.99 .M44 K84 2010
100 1 _aKundu, Sandip.
_967250
245 1 0 _aNanoscale CMOS VLSI circuits :
_bdesign for manufacturability /
_cSandip Kundu, Aswin Sreedhar.
246 1 4 _aNanoscale complementary metal oxide semiconductor very large-scale integration circuits
260 _aNew York :
_bMcGraw-Hill,
_cc2010.
300 _axv, 296 p. :
_bill. ;
_c24 cm.
336 _2rdacontent
_atext
_btxt
337 _2rdamedia
_aunmediated
_bn
338 _2rdacarrier
_avolume
_bnc
504 _aIncludes bibliographical references and index.
505 0 _aSemiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
650 0 _aMetal oxide semiconductors, Complementary
_xDesign and construction.
_980856
650 0 _aIntegrated circuits
_xVery large scale integration
_xDesign and construction.
_9154904
650 0 _aNanoelectronics.
_9111626
700 1 _aSreedhar, Aswin.
_9154905
852 1 _9P125.00usd
907 _a32405
_b05-03-11
_c04-28-11
942 _cBOOK
_00
998 _aaudmc
_b04-28-11
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999 _c32405
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